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Technology portal. v. t. e. Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope, an instrument for imaging surfaces at the atomic level. The first successful scanning tunneling ...
The Sijil Pelajaran Malaysia (SPM), or the Malaysian Certificate of Education, is a national examination sat for by all fifth-form secondary school students in Malaysia.It is the equivalent of the General Certificate of Secondary Education (GCSE) of England, Wales and Northern Ireland; the Nationals 4/5 of Scotland; and the GCE Ordinary Level (O Level) of the Commonwealth of Nations.
Pendidikan Moral. In Malaysia, Pendidikan Moral (Malay for "Moral Studies") is one of the core subjects in the Sijil Pelajaran Malaysia (SPM) examination. It is a required subject for all non-Muslim students in the public education system in Malaysia. Muslim students are required to take the Islamic Studies (Malay: Pendidikan Islam) course.
2010 version of the STPM Certificate mockup. The Malaysian Higher School Certificate (Malay: Sijil Tinggi Persekolahan Malaysia), commonly abbreviated as STPM, is a pre-university examination in Malaysia. It was formerly known as the Higher School Certificate (HSC). Since 1982, STPM has been administered by the Malaysian Examinations Council ...
Malaysian Matriculation Programme. The Malaysian Matriculation Programme (Malay: Program Matrikulasi Malaysia) is a one year pre-university preparatory programme [1] [failed verification] offered by the Ministry of Education, Malaysia. Starting 2005, the selection process for the programme is done through a race-based quota system, where 90% of ...
A probe tip is an instrument used in scanning probe microscopes (SPMs) to scan the surface of a sample and make nano-scale images of surfaces and structures. The probe tip is mounted on the end of a cantilever and can be as sharp as a single atom. In microscopy, probe tip geometry (length, width, shape, aspect ratio, and tip apex radius) and ...
Atomic force microscopy [1] (AFM) is a type of SPM, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by "feeling" or "touching" the surface with a mechanical probe.
The SPM was based on the old British School Certificate examination before it became General Certificate of Education O Levels examination, which became the GCSE (General Certificate of Secondary Education). As of 2006, students are given a GCE 'O' Level grade for their English paper in addition to the normal English SPM paper.