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The reflected ray corresponding to a given incident ray, is the ray that represents the light reflected by the surface. The angle between the surface normal and the reflected ray is known as the angle of reflection .
Reflection (physics) The reflection of Mount Hood in Mirror Lake. Reflection is the change in direction of a wavefront at an interface between two different media so that the wavefront returns into the medium from which it originated. Common examples include the reflection of light, sound and water waves. The law of reflection says that for ...
Specular reflection, or regular reflection, is the mirror -like reflection of waves, such as light, from a surface. [1] The law of reflection states that a reflected ray of light emerges from the reflecting surface at the same angle to the surface normal as the incident ray, but on the opposing side of the surface normal in the plane formed by ...
Two-ray ground-reflection model. The two-rays ground-reflection model is a multipath radio propagation model which predicts the path losses between a transmitting antenna and a receiving antenna when they are in line of sight (LOS). Generally, the two antenna each have different height. The received signal having two components, the LOS ...
Diffuse reflection is the reflection of light or other waves or particles from a surface such that a ray incident on the surface is scattered at many angles rather than at just one angle as in the case of specular reflection. An ideal diffuse reflecting surface is said to exhibit Lambertian reflection, meaning that there is equal luminance when ...
The Fresnel equations give the ratio of the reflected wave's electric field to the incident wave's electric field, and the ratio of the transmitted wave's electric field to the incident wave's electric field, for each of two components of polarization. (The magnetic fields can also be related using similar coefficients.)
Snell's law. Refraction of light at the interface between two media of different refractive indices, with n 2 > n 1. Since the velocity is lower in the second medium (v 2 < v 1 ), the angle of refraction θ 2 is less than the angle of incidence θ 1; that is, the ray in the higher-index medium is closer to the normal.
X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers.